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dc.contributor.authorNerlikas, Arūnas
dc.date.accessioned2023-09-18T08:52:23Z
dc.date.available2023-09-18T08:52:23Z
dc.date.issued2006
dc.identifier.urihttps://etalpykla.vilniustech.lt/handle/123456789/108224
dc.description.abstractThe analysis of logic device characterization have been performed. Logic device sorts and its characterization analysis was made. The analysis of other logic device test system was performed. The logic test system requirements was made. The hardware project of logic device test system and system hardware mounting was made. The software for the logic device test system was made. Experimentation of logic device test system was performed. The results of experimentation was given. Graphs about logic test system analysis of trustiness research was given. Performed finding about the logic device test system accordance for technical requirements, trustiness and universality.lit
dc.formatPDF
dc.format.extent60 p.
dc.format.mediumtekstas / txt
dc.language.isolit
dc.rightsLaisvai prieinamas internete
dc.source.urihttps://talpykla.elaba.lt/elaba-fedora/objects/elaba:2098208/datastreams/MAIN/content
dc.titleLoginių įtaisų testavimo sistemos tyrimas
dc.title.alternativeInvestigation the test sytem of logic devices
dc.typeMagistro darbas / Master thesis
dc.type.pubtypeETD_MGR - Magistro darbas / Master thesis
dc.contributor.institutionVilniaus Gedimino technikos universitetas
dc.subject.researchfieldT 001 - Elektros ir elektronikos inžinerija / Electrical and electronic engineering
dc.subject.lttest system
dc.subject.lttestavimas
dc.subject.ltloginiai įtaisai
dc.subject.ltsignature analysis
dc.subject.ltlogic device
dc.publisher.nameLithuanian Academic Libraries Network (LABT)
dc.publisher.cityKaunas
dc.identifier.elaba2098208


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