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Experimental research of improved sensor of atomic force microscope

dc.contributor.authorBučinskas, Vytautas
dc.contributor.authorDzedzickis, Andrius
dc.contributor.authorŠešok, Nikolaj
dc.contributor.authorŠutinys, Ernestas
dc.contributor.authorIljin, Igor
dc.date.accessioned2023-09-18T16:40:21Z
dc.date.available2023-09-18T16:40:21Z
dc.date.issued2016
dc.identifier.other(BIS)VGT02-000032187
dc.identifier.urihttps://etalpykla.vilniustech.lt/handle/123456789/115798
dc.format.extentp. 5
dc.format.mediumtekstas / txt
dc.language.isoeng
dc.subjectMC04 - Mechaniniai ir mechatroniniai įtaisai ir procesai / Mechanical and mechatronic devices and processes
dc.titleExperimental research of improved sensor of atomic force microscope
dc.typeKitos konferencijų pranešimų santraukos / Other conference presentation abstracts
dcterms.references0
dc.type.pubtypeT3 - Kitos konferencijos pranešimo tezės / Other conference presentation abstracts
dc.contributor.institutionVilniaus Gedimino technikos universitetas
dc.contributor.facultyMechanikos fakultetas / Faculty of Mechanics
dc.subject.researchfieldT 009 - Mechanikos inžinerija / Mechanical enginering
dc.subject.ltspecializationsL104 - Nauji gamybos procesai, medžiagos ir technologijos / New production processes, materials and technologies
dcterms.sourcetitleSCIT 2016. Systems, control and information technology, Warsaw, 20-21.05.2016 : book of abstracts
dc.publisher.nameIndustrial Research Institute for Automation and Measurements PIAP
dc.publisher.cityWarsaw
dc.identifier.elaba17176533


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