The improvement of the accuracy of electromagnetic actuator based atomic force microscope operating in contact mode and the development of a new methodology for the estimation of control parameters and the achievement of superior image quality

Abstract

The dynamics of atomic force microscope (AFM) acting in contact mode is crucial for correct interpreta-tion of AFM images and especially for the identification of artefacts and the determination of their sources.This paper presents a methodology for the interpretation and improvement of the AFM image quality.The developed AFM dynamic model has been applied for the control of scanning parameters to achievesuperior image quality. The model provides possibility to tune AFM parameters, such as tip-surface inter-action force and scanning speed in respect of the sample’s material and cantilever’s tip geometry. Thismethodology allows us to ensure the ideal imaging conditions, to evaluate AFM images and to producea superior picture quality. Using this model, we can also analyze experimental data and simulate theexperimental results.