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The fast differential amplifier-based integrated circuit yield analysis technique

dc.contributor.authorBaškys, Algirdas
dc.contributor.authorNavickas, Romualdas
dc.contributor.authorŠimkevičius, Česlovas
dc.date.accessioned2023-09-18T17:47:25Z
dc.date.available2023-09-18T17:47:25Z
dc.date.issued2010
dc.identifier.other(BIS)LBT02-000040255
dc.identifier.urihttps://etalpykla.vilniustech.lt/handle/123456789/125964
dc.format.extentp. 69
dc.format.mediumtekstas / txt
dc.language.isoeng
dc.titleThe fast differential amplifier-based integrated circuit yield analysis technique
dc.typeKonferencijos pranešimo santrauka / Conference presentation abstract
dcterms.references1
dc.type.pubtypeT2 - Konferencijos pranešimo tezės / Conference presentation abstract
dc.contributor.institutionValstybinis mokslinių tyrimų institutas Fizinių ir technologijos mokslų centras
dc.contributor.institutionVilniaus Gedimino technikos universitetas
dc.contributor.facultyElektronikos fakultetas / Faculty of Electronics
dc.subject.researchfieldT 001 - Elektros ir elektronikos inžinerija / Electrical and electronic engineering
dc.subject.ltSpartusis skirtuminis stiprintuvas
dc.subject.ltIntegrinio grandyno išeiga
dc.subject.ltModeliavimas
dc.subject.ltMonte Karlo metodas
dc.subject.enFast differential amplifier
dc.subject.enIntegrated circuit yield
dc.subject.enSimulation
dc.subject.enMonte Carlo method
dcterms.sourcetitle14th International symposium on ultrafast phenomena in semiconductors : abstracts, 23-25 August, 2010, Vilnius, Lithuania
dc.publisher.nameSemiconductor Physics Institute
dc.publisher.cityVilnius
dc.identifier.elaba5888676


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