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The accuracy of pulsed magnetoplasma interferometer measuring electrical properties of semiconductors

dc.contributor.authorLaurinavičius, Laimis
dc.contributor.authorNovickij, Jurij
dc.contributor.authorFilipavičius, Viktoras
dc.date.accessioned2023-09-18T18:38:49Z
dc.date.available2023-09-18T18:38:49Z
dc.date.issued2001
dc.identifier.other(BIS)VGT02-000003052
dc.identifier.urihttps://etalpykla.vilniustech.lt/handle/123456789/130153
dc.format.extentp. 203-206
dc.format.mediumtekstas / txt
dc.language.isoeng
dc.titleThe accuracy of pulsed magnetoplasma interferometer measuring electrical properties of semiconductors
dc.typeStraipsnis kitame recenzuotame leidinyje / Article in other peer-reviewed source
dcterms.references0
dc.type.pubtypeS4 - Straipsnis kitame recenzuotame leidinyje / Article in other peer-reviewed publication
dc.contributor.institutionVilniaus Gedimino technikos universitetas
dc.contributor.facultyElektronikos fakultetas / Faculty of Electronics
dc.subject.researchfieldT 001 - Elektros ir elektronikos inžinerija / Electrical and electronic engineering
dcterms.sourcetitleMeasurement science review : journal of the institute of measurement science Slovak academy of sciences
dc.description.issuenr.1
dc.description.volumeVol. 1
dc.publisher.nameInstitute of Measurement Science
dc.publisher.cityBratislava
dc.identifier.elaba3588693


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