dc.contributor.author | Marcinkevičius, Albinas Jonas | |
dc.contributor.author | Poviliauskas, Darius | |
dc.contributor.author | Jasonis, Vaidas | |
dc.date.accessioned | 2023-09-18T19:30:42Z | |
dc.date.available | 2023-09-18T19:30:42Z | |
dc.date.issued | 2005 | |
dc.identifier.issn | 1063-7397 | |
dc.identifier.other | (BIS)VGT02-000011701 | |
dc.identifier.uri | https://etalpykla.vilniustech.lt/handle/123456789/140246 | |
dc.description.abstract | A theoretical basis is proposed for the layout optimization of flash ADCs to be operated in the subnanosecond range. A mathematical model and a layout-synthesis procedure are presented for comparator signal lines with distributed parameters. An algorithm is described for the computer-aided construction and solution of equations for comparator transfer functions. The results are reported of a transient analysis for the comparators of microwave ADCs differing in the arrangement and parameters of the microstrip signal lines. Layouts are displayed for 6-bit ADCs with different configurations of the comparator subsystem. The results are presented of a time-domain computer simulation for 6-bit ADCs. | eng |
dc.format | PDF | |
dc.format.extent | p. 187-201 | |
dc.format.medium | tekstas / txt | |
dc.language.iso | eng | |
dc.relation.isreferencedby | SpringerLink | |
dc.relation.isreferencedby | INSPEC | |
dc.relation.isreferencedby | Compendex | |
dc.relation.isreferencedby | Academic Search Premier | |
dc.source.uri | https://doi.org/10.1007/s11180-005-0028-1 | |
dc.title | Transient analysis of subnanosecond integrated ADCs | |
dc.type | Straipsnis Scopus DB / Article in Scopus DB | |
dcterms.references | 21 | |
dc.type.pubtype | S2 - Straipsnis Scopus DB / Scopus DB article | |
dc.contributor.institution | Vilniaus Gedimino technikos universitetas | |
dc.contributor.faculty | Elektronikos fakultetas / Faculty of Electronics | |
dc.subject.researchfield | T 001 - Elektros ir elektronikos inžinerija / Electrical and electronic engineering | |
dcterms.sourcetitle | Russian Microelectronics | |
dc.description.issue | no. 3 | |
dc.description.volume | Vol. 34 | |
dc.publisher.name | MAIK Nauka/Interperiodic | |
dc.publisher.city | New York | |
dc.identifier.doi | 10.1007/s11180-005-0028-1 | |
dc.identifier.elaba | 3725630 | |