Rodyti trumpą aprašą

dc.contributor.authorRaudys, Šarūnas
dc.date.accessioned2023-09-18T19:37:58Z
dc.date.available2023-09-18T19:37:58Z
dc.date.issued2006
dc.identifier.issn0302-9743
dc.identifier.other(BIS)VGT02-000012733
dc.identifier.urihttps://etalpykla.vilniustech.lt/handle/123456789/141554
dc.description.abstractWe propose probabilistic framework for analysis of inaccuracies due to feature selection (FS) when flawed estimates of performance of feature subsets are utilized. The approach is based on analysis of random search FS procedure and postulation that joint distribution of true and estimated classification errors is known a priori. We derive expected values for the FS bias, a difference between actual classification error after FS and classification error if ideal FS is performed according to exact estimates. The increase in true classification error due to inaccurate FS is comparable or even exceeds a training bias, a difference between generalization and Bayes errors. We have shown that there exists overfitting phenomenon in feature selection, entitled in this paper as feature over-selection. The effects of feature over-selection could be reduced if FS would be performed on basis of positional statistics. Theoretical results are supported by experiments carried out on simulated Gaussian data, as well as on high dimensional microarray gene expression data.eng
dc.formatPDF
dc.format.extentp. 622-631
dc.format.mediumtekstas / txt
dc.language.isoeng
dc.relation.isreferencedbyConference Proceedings Citation Index - Science (Web of Science)
dc.relation.isreferencedbySpringerLink
dc.relation.isreferencedbyScience Citation Index Expanded (Web of Science)
dc.relation.isreferencedbyCompendex
dc.relation.isreferencedbyMathSciNet
dc.relation.isreferencedbyGeoRef
dc.source.urihttps://doi.org/10.1007/11815921_68
dc.titleFeature over-selection
dc.typeStraipsnis Web of Science DB / Article in Web of Science DB
dcterms.accessRightsLBT: Tomo antraštė: Structural, syntactic, and statistical pattern recognition : Joint IAPR international workshops, SSPR 2006 and SPR 2006 : Hong Kong, China, August 17-19, 2006 : Proceedings.
dcterms.references17
dc.type.pubtypeS1 - Straipsnis Web of Science DB / Web of Science DB article
dc.contributor.institutionVilniaus Gedimino technikos universitetas
dc.contributor.facultyFundamentinių mokslų fakultetas / Faculty of Fundamental Sciences
dc.subject.researchfieldN 009 - Informatika / Computer science
dc.subject.researchfieldT 007 - Informatikos inžinerija / Informatics engineering
dcterms.sourcetitleStructural, Syntactic, and Statistical Pattern Recognition : Joint IAPR International Workshops SSPR 2006 and SPR 2006 Hong Kong, China, August 2006 : proceedings. Lecture Notes in Computer Science
dc.description.volumeVol. 4109
dc.publisher.nameSpringer
dc.publisher.cityBerlin
dc.identifier.doiLBT02-000023268
dc.identifier.doi000240075100068
dc.identifier.doi10.1007/11815921_68
dc.identifier.elaba3742940


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