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dc.contributor.authorBaškys, Algirdas
dc.contributor.authorBleizgys, Vytautas
dc.date.accessioned2023-09-18T20:28:31Z
dc.date.available2023-09-18T20:28:31Z
dc.date.issued2008
dc.identifier.issn1811-4512
dc.identifier.other(BIS)LBT02-000031578
dc.identifier.urihttps://etalpykla.vilniustech.lt/handle/123456789/150092
dc.description.abstractThe equation, which relate the boundary concentrations of majority carriers with the voltage drop across the p-n junction, have been derived. The derivation is carried out on the basis of the Boltzmann relations and charge quasi-neutrality conditions. The obtained equations allow us to investigate the adaptability of the majority carrier concentration permanence assumption in modeling of the junctions. The concrete silicon p-n junctions have been analyzed using derived equations.eng
dc.format.extentp. 26-29
dc.format.mediumtekstas / txt
dc.language.isoeng
dc.titleAdaptibility of the majority carrier concentration permanence assumption in modeling of the junctions
dc.typeStraipsnis kitame recenzuotame leidinyje / Article in other peer-reviewed source
dcterms.references5
dc.type.pubtypeS4 - Straipsnis kitame recenzuotame leidinyje / Article in other peer-reviewed publication
dc.contributor.institutionPuslaidininkių fizikos institutas Vilniaus Gedimino technikos universitetas
dc.contributor.facultyElektronikos fakultetas / Faculty of Electronics
dc.subject.researchfieldT 001 - Elektros ir elektronikos inžinerija / Electrical and electronic engineering
dc.subject.ltP-n perėjimas
dc.subject.ltPuslaidininkiniai prietaisai
dc.subject.enP-n junction
dc.subject.enSemiconductor devices
dcterms.sourcetitleЭлектроника и связь
dc.description.issue№ 1-2
dc.identifier.doiVGT02-000024565
dc.identifier.elaba5794836


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