Browsing Konferencijų straipsniai / Conference Articles by Institution ""Precizika metrology" UAB"

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    • Analysis of dynamic method of line scales detection 

      Barakauskas, Algimantas; Kasparaitis, Albinas; Kaušinis, Saulius; Lazdinas, Rimantas (Solid State Phenomena: Mechatronic Systems and Materials III, 2009)
      The main causes of uncertainty in measurement regarding long-stroke line scales are line detection errors and external factors, especially temperature effects. The number of calibration errors of this sort increases with ...

    • Dynamic method of grating scale calibration by photosensitive cell matrix 

      Barakauskas, Algimantas; Kasparaitis, Albinas; Lazdinas, Rimantas (REM 2007: 8 th international workshop on research and education in mechatronics: June 14-15, 2007, Tallinn, Estonia, 2007)
      A dynamic method of linear scale calibration by means of a photosensitive cell matrix is presented in this paper. Such a method using an ultra-fast global shutter camera is applied in a long grating scale calibration ...

    • Informative 2D scales of measurement systems design and metrological characteristics 

      Bardauskas, Karolis; Kasparaitis, Albinas; Zakas, Gintautas (Mechanika-2011: proceedings of the 16th international conference, 7, 8 April, 2011, Kaunas University of Technology, Lithuania, 2011)
      The report briefly reviews the linear displacement measuring systems and the information that they provide in terms of quantity. It also provides an overview of the features of their scales. The report analyzes the scales ...

    • Line scale calibration in non-ideal measurement situation 

      Kaušinis, Saulius; Kasparaitis, Albinas; Barakauskas, Algimantas; Barauskas, Rimantas; Jakštas, Aurimas; Kilikevičius, Artūras (Solid State Phenomena: Mechatronic Systems and Materials III, 2009)
      The precision line scale calibration in dynamical mode of operation is considered. A new interferometer-controlled comparator with moving microscope has been developed and optimised in order to reduce both the measurement ...