Research of modified mechanical sensor of atomic force microscope

Abstract

Atomic force microscope (AFM) is a remarkable device for nanoscale surface scanning. Among several positive features, speed of a scanning limits implementation of AFM. This paper proposes method that enables to increase a speed of scanning by modifying some features of mechanical sensor by adding a nonlinear force to lever of a mechanical sensor of AFM. Proposed method is modeled theoretically, using Simulink features by realizing original algorithm, and researched experimentally, using original modification of AFM sensor. Original results are obtained after a research is performed. Finally, comparison of results of original and modified AFM scans is made and corresponding conclusions are drawn.