Analysis of spoof surface plasmons in spoof-insulator-spoof waveguides

Abstract

Herein, we present a detailed analysis of the propagation of surface waves along spoof-insulator-spoof (SIS) waveguides. Analytical dispersion equations are derived for the geometry under investigation, in view of the presence of the semiconductor and transparent conducting oxide (TCO) corrugations. More importantly, the proposed formulation reveals a fundamental connection between surface plasmons found in corrugated semiconductors as well as TCO and SIS structures. We envision that the proposed SIS structure may serve as a building block for optical resonators, waveguide bends, and splitters.