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dc.contributor.authorKladovščikov, Leonid
dc.contributor.authorNavickas, Romualdas
dc.date.accessioned2023-09-18T17:02:44Z
dc.date.available2023-09-18T17:02:44Z
dc.date.issued2017
dc.identifier.urihttps://etalpykla.vilniustech.lt/handle/123456789/119266
dc.description.abstractIntegrated circuit fabrication technological processes affect error of transceiver’s parameters. Such deviation of parameters are meant to be estimated and tuned up to desired. This paper describes self-test and self-calibration systems of active RC low pass filters. Main parameters to be estimated and tuned are cut-off frequency, gain and band-pass linearity. Self-calibration system is designed in 0,18 μm technology node, with 1.8 V supply voltage for 10 MHz application. Designed self-calibration system tuning accuracy varies from 0,8 % to 1 %.eng
dc.formatPDF
dc.format.extentp. 1-4
dc.format.mediumtekstas / txt
dc.language.isoeng
dc.relation.isreferencedbyScopus
dc.relation.isreferencedbyIEEE Xplore
dc.relation.isreferencedbyConference Proceedings Citation Index - Science (Web of Science)
dc.source.urihttp://ieeexplore.ieee.org/document/8270545/
dc.subjectIK02 - Išmaniosios komunikacijų technologijos / Smart communication technologies
dc.titleDesign of self-test and self-calibration systems for analog active RC filters
dc.typeStraipsnis konferencijos darbų leidinyje Web of Science DB / Paper in conference publication in Web of Science DB
dcterms.references15
dc.type.pubtypeP1a - Straipsnis konferencijos darbų leidinyje Web of Science DB / Article in conference proceedings Web of Science DB
dc.contributor.institutionVilniaus Gedimino technikos universitetas
dc.contributor.facultyElektronikos fakultetas / Faculty of Electronics
dc.subject.researchfieldT 001 - Elektros ir elektronikos inžinerija / Electrical and electronic engineering
dc.subject.ltspecializationsL106 - Transportas, logistika ir informacinės ir ryšių technologijos (IRT) / Transport, logistic and information and communication technologies
dc.subject.enIntegrated circuit
dc.subject.enTransceiver
dc.subject.enSelf-testing
dc.subject.enSelf-calibration
dc.subject.enAnalog active RC filter
dc.subject.enAnalog to digital converter
dcterms.sourcetitleThe 5th IEEE Workshop on Advances in Information, Electronic and Electrical Engineering (AIEEE’2017), Riga, Latvia, November 24–25, 2017 : proceedings
dc.publisher.nameIEEE
dc.publisher.cityNew York
dc.identifier.doi000428137800023
dc.identifier.doi2-s2.0-85050641320
dc.identifier.doi10.1109/AIEEE.2017.8270545
dc.identifier.elaba25915540


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