| dc.contributor.author | Daškevičius, Vladislavas | |
| dc.contributor.author | Skudutis, Julius | |
| dc.contributor.author | Štaras, Stanislovas | |
| dc.date.accessioned | 2023-09-18T17:21:58Z | |
| dc.date.available | 2023-09-18T17:21:58Z | |
| dc.date.issued | 2008 | |
| dc.identifier.other | (BIS)VGT02-000018251 | |
| dc.identifier.uri | https://etalpykla.vilniustech.lt/handle/123456789/122400 | |
| dc.description.abstract | We propose to use the synergy of analytical and numerical methods for simulation of slow-wave structures in order to reveal properties of the structures and improve the quality of design. As an example, the multi-conductor method and the CST software package Microwave Studio are effectively used for solution of problems related to meander slow-wave structures. | eng |
| dc.format | PDF | |
| dc.format.extent | p. 95-98 | |
| dc.format.medium | tekstas / txt | |
| dc.language.iso | eng | |
| dc.relation.isreferencedby | Conference Proceedings Citation Index - Science (Web of Science) | |
| dc.title | Simulation of slow-wave structures using synergy of various methods | |
| dc.type | Straipsnis konferencijos darbų leidinyje Web of Science DB / Paper in conference publication in Web of Science DB | |
| dcterms.accessRights | IDS Number: BIN17 | |
| dcterms.references | 8 | |
| dc.type.pubtype | P1a - Straipsnis konferencijos darbų leidinyje Web of Science DB / Article in conference proceedings Web of Science DB | |
| dc.contributor.institution | Vilniaus Gedimino technikos universitetas | |
| dc.contributor.faculty | Elektronikos fakultetas / Faculty of Electronics | |
| dc.subject.researchfield | T 001 - Elektros ir elektronikos inžinerija / Electrical and electronic engineering | |
| dcterms.sourcetitle | BEC 2008: proceedings of the 11th International Biennial Baltic Electronics Conference. Tallinn, Estonia, October 6-8, 2008 / Tallinn University of Technology, IEEE Circuits and Systems Society. 11th Biennial Baltic Electronics Conference Tallinn Univ Technol, Tallinn, ESTONIA, OCT 06-08, 2008 | |
| dc.publisher.name | IEEE | |
| dc.publisher.city | New York | |
| dc.identifier.doi | 000260994900013 | |
| dc.identifier.doi | 10.1109/BEC.2008.4657486 | |
| dc.identifier.elaba | 3854253 | |
