The analysis of defects propagation in navigating electronic devices

Abstract

Defects in the form of microcracks in Ti8C12 contacts of passive electronic components of navigating devices operating at different temperatures and pressure were analyzed. Research results have demonstrated the possibility of early prevention of potential accidents. Microscopic studies are systematized depending on various physical and chemical influences on devices. The mathematical model for defects definition in local points of contacts with an error of about 5 - 7.5 % has been applied.