The application of the bivariate distribution and mutual information in measurement

Abstract

The measuring systems, such as those used in coordinate measuring machines (CMMs), laser interferometers, linear or rotary encoders, etc., feature of huge amount of information indicating the position of the object under control. This information is subject for verification or metrological calibration during some periods in service. On the other hand, there are no means for verifying every digit of output information, and the great quantity of information consisting of millions of values is left with its errors undetermined. Expression of the result of measurement (including the calibration) of a measuring system supplementing it by the parameter of information entropy is proposed in the paper. The uncertainty expression in the result of measurement in the plane and in the volume is presented here with the parameter of information entropy that shows the portion of data assessed.