dc.contributor.author | Jankauskas, Zigmantas | |
dc.contributor.author | Kvedaras, Vygaudas | |
dc.contributor.author | Gaivenis, Rimtautas | |
dc.date.accessioned | 2023-09-18T17:33:19Z | |
dc.date.available | 2023-09-18T17:33:19Z | |
dc.date.issued | 2009 | |
dc.identifier.other | (BIS)VGT02-000019566 | |
dc.identifier.uri | https://etalpykla.vilniustech.lt/handle/123456789/124268 | |
dc.description.abstract | Many semiconductor materials manufactured by the help of nanotechnology have the charge carriers of different type and mobility. Already existing carrier density and mobility measurement methods are not accurate enough for the case of several carrier components. The use of the magnetoplasmic waves provides a simple and most precise way to determine the density and mobility of each type of the carriers (electrons and/or holes). Magnetoplasmic Waves may be excited in semiconductors when the strong magnetic field H is applied. The semiconductor sample becomes partially transparent under these conditions In the case of magnetoplasmic resonance within each of carrier groups the transparence coefficient has maximum. For fixed values H and excitation frequency ω the density and mobility of every carrier type can be found. Dispersion relation for two types of charge carriers is obtained and resonance curves are calculated. | eng |
dc.format.extent | p. 254-257 | |
dc.format.medium | tekstas / txt | |
dc.language.iso | eng | |
dc.title | The magnetoplasmic measurements of the carrier density and mobility in semiconductors | |
dc.type | Straipsnis recenzuotame konferencijos darbų leidinyje / Paper published in peer-reviewed conference publication | |
dc.type.pubtype | P1d - Straipsnis recenzuotame konferencijos darbų leidinyje / Article published in peer-reviewed conference proceedings | |
dc.contributor.institution | Vilniaus Gedimino technikos universitetas | |
dc.contributor.institution | Vilniaus kolegija | |
dc.contributor.faculty | Elektronikos fakultetas / Faculty of Electronics | |
dc.subject.researchfield | T 001 - Elektros ir elektronikos inžinerija / Electrical and electronic engineering | |
dc.subject.en | Magnetic measurement | |
dc.subject.en | Imaging | |
dc.subject.en | Magnetic susceptibility | |
dc.subject.en | Helicons | |
dc.subject.en | Calculation | |
dcterms.sourcetitle | Measurement 2009: 7th international conference on measurement : proceedings, Smolenice Castle, Slovakia, May 20-23, 2009 | |
dc.publisher.name | Institute of Measurement Science | |
dc.publisher.city | Bratislava | |
dc.identifier.elaba | 3878914 | |