Show simple item record

dc.contributor.authorJankauskas, Zigmantas
dc.contributor.authorKvedaras, Vygaudas
dc.contributor.authorGaivenis, Rimtautas
dc.date.accessioned2023-09-18T17:33:19Z
dc.date.available2023-09-18T17:33:19Z
dc.date.issued2009
dc.identifier.other(BIS)VGT02-000019566
dc.identifier.urihttps://etalpykla.vilniustech.lt/handle/123456789/124268
dc.description.abstractMany semiconductor materials manufactured by the help of nanotechnology have the charge carriers of different type and mobility. Already existing carrier density and mobility measurement methods are not accurate enough for the case of several carrier components. The use of the magnetoplasmic waves provides a simple and most precise way to determine the density and mobility of each type of the carriers (electrons and/or holes). Magnetoplasmic Waves may be excited in semiconductors when the strong magnetic field H is applied. The semiconductor sample becomes partially transparent under these conditions In the case of magnetoplasmic resonance within each of carrier groups the transparence coefficient has maximum. For fixed values H and excitation frequency ω the density and mobility of every carrier type can be found. Dispersion relation for two types of charge carriers is obtained and resonance curves are calculated.eng
dc.format.extentp. 254-257
dc.format.mediumtekstas / txt
dc.language.isoeng
dc.titleThe magnetoplasmic measurements of the carrier density and mobility in semiconductors
dc.typeStraipsnis recenzuotame konferencijos darbų leidinyje / Paper published in peer-reviewed conference publication
dc.type.pubtypeP1d - Straipsnis recenzuotame konferencijos darbų leidinyje / Article published in peer-reviewed conference proceedings
dc.contributor.institutionVilniaus Gedimino technikos universitetas
dc.contributor.institutionVilniaus kolegija
dc.contributor.facultyElektronikos fakultetas / Faculty of Electronics
dc.subject.researchfieldT 001 - Elektros ir elektronikos inžinerija / Electrical and electronic engineering
dc.subject.enMagnetic measurement
dc.subject.enImaging
dc.subject.enMagnetic susceptibility
dc.subject.enHelicons
dc.subject.enCalculation
dcterms.sourcetitleMeasurement 2009: 7th international conference on measurement : proceedings, Smolenice Castle, Slovakia, May 20-23, 2009
dc.publisher.nameInstitute of Measurement Science
dc.publisher.cityBratislava
dc.identifier.elaba3878914


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following Collection(s)

Show simple item record