dc.contributor.author | Metlevskis, Edvardas | |
dc.contributor.author | Urbanavičius, Vytautas | |
dc.date.accessioned | 2023-09-18T17:50:50Z | |
dc.date.available | 2023-09-18T17:50:50Z | |
dc.date.issued | 2010 | |
dc.identifier.other | (BIS)VGT02-000021534 | |
dc.identifier.uri | https://etalpykla.vilniustech.lt/handle/123456789/126856 | |
dc.description.abstract | Rectangular microstrip structures (RMS) are widely used in various microwave devices. Using the method of moments and principle of partial images, various techniques are created to determine charge distribution in 2D models of microstrip structures (their cross-section). In this paper, a technique for calculating surface charge distribution and total capacitance of complex 3D rectangular microstrip structures is proposed using the mentioned method and principle. To demonstrate feasibility of the proposed technique, three RMS were investigated. Obtained results are compared with the data published by other researches. Total error is typically less than 5%. | eng |
dc.format.extent | p. 228-231 | |
dc.format.medium | tekstas / txt | |
dc.language.iso | eng | |
dc.relation.isreferencedby | Conference Proceedings Citation Index - Science (Web of Science) | |
dc.relation.isreferencedby | IEEE Xplore | |
dc.source.uri | http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5540460 | |
dc.title | Analysis of rectangular microstrip structures by the method of moments | |
dc.type | Straipsnis konferencijos darbų leidinyje Web of Science DB / Paper in conference publication in Web of Science DB | |
dcterms.accessRights | IEEE Catalog number: CFP10784-PRT
IDS Number: BXN37 | |
dcterms.references | 16 | |
dc.type.pubtype | P1a - Straipsnis konferencijos darbų leidinyje Web of Science DB / Article in conference proceedings Web of Science DB | |
dc.contributor.institution | Vilniaus Gedimino technikos universitetas | |
dc.contributor.faculty | Elektronikos fakultetas / Faculty of Electronics | |
dc.subject.researchfield | T 001 - Elektros ir elektronikos inžinerija / Electrical and electronic engineering | |
dc.subject.en | Rectangular microstrip structure (RMS) | |
dc.subject.en | Surface charge distribution | |
dc.subject.en | Efective dielectric permittivity | |
dc.subject.en | Method of moments (MoM) | |
dc.subject.en | Principle of partial images | |
dc.subject.en | Total capacitance | |
dcterms.sourcetitle | 18th international conference on microwave, radar and wireless communications (MIKON-2010). 4th Microwave and radar week (MRW-2010). Vilnius, Lithuania, June 14-16, 2010 : conference proceedings | |
dc.description.volume | Vol. 1 | |
dc.publisher.name | GEOZONDAS Ltd | |
dc.publisher.city | Vilnius | |
dc.identifier.doi | 000296519300058 | |
dc.identifier.elaba | 3916824 | |