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dc.contributor.authorMetlevskis, Edvardas
dc.contributor.authorUrbanavičius, Vytautas
dc.date.accessioned2023-09-18T17:50:50Z
dc.date.available2023-09-18T17:50:50Z
dc.date.issued2010
dc.identifier.other(BIS)VGT02-000021534
dc.identifier.urihttps://etalpykla.vilniustech.lt/handle/123456789/126856
dc.description.abstractRectangular microstrip structures (RMS) are widely used in various microwave devices. Using the method of moments and principle of partial images, various techniques are created to determine charge distribution in 2D models of microstrip structures (their cross-section). In this paper, a technique for calculating surface charge distribution and total capacitance of complex 3D rectangular microstrip structures is proposed using the mentioned method and principle. To demonstrate feasibility of the proposed technique, three RMS were investigated. Obtained results are compared with the data published by other researches. Total error is typically less than 5%.eng
dc.format.extentp. 228-231
dc.format.mediumtekstas / txt
dc.language.isoeng
dc.relation.isreferencedbyConference Proceedings Citation Index - Science (Web of Science)
dc.relation.isreferencedbyIEEE Xplore
dc.source.urihttp://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5540460
dc.titleAnalysis of rectangular microstrip structures by the method of moments
dc.typeStraipsnis konferencijos darbų leidinyje Web of Science DB / Paper in conference publication in Web of Science DB
dcterms.accessRightsIEEE Catalog number: CFP10784-PRT IDS Number: BXN37
dcterms.references16
dc.type.pubtypeP1a - Straipsnis konferencijos darbų leidinyje Web of Science DB / Article in conference proceedings Web of Science DB
dc.contributor.institutionVilniaus Gedimino technikos universitetas
dc.contributor.facultyElektronikos fakultetas / Faculty of Electronics
dc.subject.researchfieldT 001 - Elektros ir elektronikos inžinerija / Electrical and electronic engineering
dc.subject.enRectangular microstrip structure (RMS)
dc.subject.enSurface charge distribution
dc.subject.enEfective dielectric permittivity
dc.subject.enMethod of moments (MoM)
dc.subject.enPrinciple of partial images
dc.subject.enTotal capacitance
dcterms.sourcetitle18th international conference on microwave, radar and wireless communications (MIKON-2010). 4th Microwave and radar week (MRW-2010). Vilnius, Lithuania, June 14-16, 2010 : conference proceedings
dc.description.volumeVol. 1
dc.publisher.nameGEOZONDAS Ltd
dc.publisher.cityVilnius
dc.identifier.doi000296519300058
dc.identifier.elaba3916824


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