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The accuracy of pulsed magnetoplasma interferometer measuring electrical properties of semiconductors

dc.contributor.authorLaurinavičius, Laimis
dc.contributor.authorNovickij, Jurij
dc.contributor.authorFilipavičius, Viktoras
dc.date.accessioned2023-09-18T18:34:59Z
dc.date.available2023-09-18T18:34:59Z
dc.date.issued2001
dc.identifier.other(BIS)VGT02-000002489
dc.identifier.urihttps://etalpykla.vilniustech.lt/handle/123456789/129528
dc.format.extentp. 57-60
dc.format.mediumtekstas / txt
dc.language.isoeng
dc.titleThe accuracy of pulsed magnetoplasma interferometer measuring electrical properties of semiconductors
dc.typeStraipsnis recenzuotame konferencijos darbų leidinyje / Paper published in peer-reviewed conference publication
dc.type.pubtypeP1d - Straipsnis recenzuotame konferencijos darbų leidinyje / Article published in peer-reviewed conference proceedings
dc.contributor.institutionVilniaus Gedimino technikos universitetas
dc.contributor.facultyElektronikos fakultetas / Faculty of Electronics
dc.subject.researchfieldT 001 - Elektros ir elektronikos inžinerija / Electrical and electronic engineering
dcterms.sourcetitleMeasurement 2001 : proceedings 3rd international conference on measurement, Smolenice, Slovak Republic May 14-17, 2001
dc.publisher.nameInstitute of Measurement Science of the Slovak Academy of Sciences
dc.publisher.cityBratislava
dc.identifier.elaba3577621


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