Measurements of propagation delay times of high-speed logic Ics

Abstract

The new tester for the measurement of the propagation delay times in high-speed IC logic by the use of multichannel sample converter is considered. The multichannel sample converter is a rather simple device with a small level of internal noise and was developed on the basis of peak detecting sample converter with two quartz generators. The two models of the tester is developed and researched. The measurement error of propagation delay times does not exceed ± 5%.