Rodyti trumpą aprašą

dc.contributor.authorAšmontas, Steponas
dc.contributor.authorGradauskas, Jonas
dc.contributor.authorZagadskij, Viktor
dc.contributor.authorStupakova, Jolanta
dc.contributor.authorSužiedėlis, Algirdas
dc.contributor.authorŠatkovskis, Eugenijus
dc.date.accessioned2023-09-18T19:43:00Z
dc.date.available2023-09-18T19:43:00Z
dc.date.issued2006
dc.identifier.issn1063-7850
dc.identifier.other(BIS)VGT02-000013474
dc.identifier.urihttps://etalpykla.vilniustech.lt/handle/123456789/142490
dc.description.abstractTwo types of structures comprising porous silicon (por-Si) layers between metal electrodes were prepared, which possessed nonlinear (A type) and linear (B type) current–voltage characteristics. The exposure to microwave radiation leads to the appearance of an emf between electrodes. The B-type structures exhibit high voltage responsivity and can be used as microwave radiation sensors.eng
dc.formatPDF
dc.format.extentp. 603-605
dc.format.mediumtekstas / txt
dc.language.isoeng
dc.relation.isreferencedbySpringerLink
dc.relation.isreferencedbyScience Citation Index Expanded (Web of Science)
dc.relation.isreferencedbyINSPEC
dc.relation.isreferencedbyAcademic Search Premier
dc.relation.isreferencedbyPascal
dc.source.urihttp://dx.doi.org/doi:10.1134/S1063785006070169
dc.titleMicrowave detectors based on porous silicon
dc.typeStraipsnis Web of Science DB / Article in Web of Science DB
dcterms.accessRightsIDS Number: 070KW
dcterms.references15
dc.type.pubtypeS1 - Straipsnis Web of Science DB / Web of Science DB article
dc.contributor.institutionPuslaidininkių fizikos institutas
dc.contributor.institutionVilniaus Gedimino technikos universitetas Puslaidininkių fizikos institutas
dc.contributor.institutionVilniaus Gedimino technikos universitetas
dc.contributor.facultyFundamentinių mokslų fakultetas / Faculty of Fundamental Sciences
dc.contributor.departmentFizikos katedra / Department of Physics
dc.subject.researchfieldN 002 - Fizika / Physics
dc.subject.ltAkytasis silicis
dc.subject.ltMikrobangų detektoriai
dc.subject.ltMikroelektronika
dc.subject.ltNanoelektronika
dc.subject.enPorous silicon
dc.subject.enMicrowave detectors
dc.subject.enMicroelectronics
dc.subject.enNanoelectronics
dcterms.sourcetitleTechnical physics letters
dc.description.issueiss. 7
dc.description.volumeVol. 32
dc.publisher.nameMAIK Nauka/Interperiodic
dc.publisher.cityNew York
dc.identifier.doiLBT02-000020881
dc.identifier.doi000239522300016
dc.identifier.doi10.1134/S1063785006070169
dc.identifier.elaba3756695


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