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dc.contributor.authorUšinskas, Andrius
dc.contributor.authorGleiznienė, Rymantė
dc.date.accessioned2023-09-18T19:44:38Z
dc.date.available2023-09-18T19:44:38Z
dc.date.issued2006
dc.identifier.other(BIS)VGT02-000014087
dc.identifier.urihttps://etalpykla.vilniustech.lt/handle/123456789/142929
dc.description.abstractThis paper presents the recognition of ischemic stroke region of human head. Such method consists of six stages: pre-processing of computed tomograms, segmentation of ischemic stroke, computing of the centre of a stroke region, ray tracing, smoothing of determined stroke contour and expansion of it. The comparison analysis of automatically recognized stroke regions with regions, marked by four radiologists in 300 slices, showed mean value of stroke recognition which was bigger than minimal congruity factor between two radiologists.eng
dc.formatPDF
dc.format.extentp. 221-224
dc.format.mediumtekstas / txt
dc.language.isoeng
dc.relation.isreferencedbyConference Proceedings Citation Index - Science (Web of Science)
dc.relation.isreferencedbyIEEE Xplore
dc.source.urihttp://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=4100324
dc.titleIschemic stroke region recognition based on ray tracing
dc.typeStraipsnis konferencijos darbų leidinyje Web of Science DB / Paper in conference publication in Web of Science DB
dcterms.references12
dc.type.pubtypeP1a - Straipsnis konferencijos darbų leidinyje Web of Science DB / Article in conference proceedings Web of Science DB
dc.contributor.institutionVilniaus Gedimino technikos universitetas
dc.contributor.institutionKauno medicinos universitetas
dc.contributor.facultyElektronikos fakultetas / Faculty of Electronics
dc.subject.researchfieldM 001 - Medicina / Medicine
dc.subject.researchfieldT 007 - Informatikos inžinerija / Informatics engineering
dc.subject.enstroke
dc.subject.enradiography
dc.subject.enhuman head
dcterms.sourcetitleBEC 2006: proceedings of the 10th Biennial Baltic Electronics Conference, October 2-4, 2006, Tallinn, Estonia / Tallinn University of Technology, IEEE Circuits and Systems Society
dc.publisher.nameIEEE
dc.publisher.cityNew York
dc.identifier.doiKMU02-000031087
dc.identifier.doi000244029600054
dc.identifier.doi10.1109/BEC.2006.311103
dc.identifier.elaba3768968


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