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dc.contributor.authorBarauskas, Saulius
dc.contributor.authorJankauskas, Zigmantas
dc.contributor.authorKvedaras, Vygaudas
dc.contributor.authorSouslov, A.
dc.date.accessioned2023-09-18T19:52:43Z
dc.date.available2023-09-18T19:52:43Z
dc.date.issued2007
dc.identifier.other(BIS)VGT02-000014646
dc.identifier.urihttps://etalpykla.vilniustech.lt/handle/123456789/144205
dc.description.abstractIn the semiconductors when the strong constant magnetic field H is applied the nondissipative Hall currents appear and helicon magnetoplasmic waves may be excited. The semiconductor sample becomes partially transparent under these conditions. In the case of resonance the transparency coefficient has maximum or minimum depending of resonance number. For fixed values of H and excitation frequency ω the charge density and mobility may be found. Measurements were conducted in the range of radio frequencies 10-2000 MHz, and magnetic fields 0-32 Tesla for n-InSb and n-Ge.eng
dc.format.extentp. 176-180
dc.format.mediumtekstas / txt
dc.language.isoeng
dc.relation.isreferencedbyISI Proceedings (nenaudotinas)
dc.titleMeasurement of charge density and mobility in semiconductors in the strong magnetic field
dc.typeStraipsnis konferencijos darbų leidinyje Web of Science DB / Paper in conference publication in Web of Science DB
dcterms.references3
dc.type.pubtypeP1a - Straipsnis konferencijos darbų leidinyje Web of Science DB / Article in conference proceedings Web of Science DB
dc.contributor.institutionVilniaus Gedimino technikos universitetas
dc.contributor.institutionNational High Magnetic Field Laboratory
dc.contributor.facultyElektronikos fakultetas / Faculty of Electronics
dc.contributor.departmentElektrotechnikos katedra / Department of Electrical Engineering
dc.subject.researchfieldT 001 - Elektros ir elektronikos inžinerija / Electrical and electronic engineering
dc.subject.enN-InSb
dc.subject.enN-Ge
dc.subject.enMagnetic fields
dcterms.sourcetitleMeasurement 2007. The 6th International Conference on Measurement. Smolenice, Slovakia, May 20-24, 2007 : proceedings / Slovak Academy of Sciences
dc.publisher.nameInstitute of Measurement Science
dc.publisher.cityBratislava
dc.identifier.elaba3780445


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