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dc.contributor.authorGradauskas, Jonas
dc.contributor.authorStupakova, Jolanta
dc.contributor.authorSužiedėlis, Algirdas
dc.contributor.authorSamuolienė, Neringa
dc.date.accessioned2023-09-18T20:20:46Z
dc.date.available2023-09-18T20:20:46Z
dc.date.issued2014
dc.identifier.issn0277-786X
dc.identifier.other(BIS)LBT02-000052492
dc.identifier.urihttps://etalpykla.vilniustech.lt/handle/123456789/149114
dc.description.abstractWe report on possibility to detect pulsed microwave radiation across the metal/oxide/porous silicon structures and analyse possible physical reasons causing the rise of the emf voltage signal. The n-type porous layers were fabricated according to conventional electrochemical etching procedure, and were exposed to pulsed 10 GHz microwave radiation. The results of investigation show that the porous Si samples have higher by at least one order voltage-to-power sensitivity than the samples without the porous layer, and are considered to have high potential to increase it further. Free carrier heating phenomenon is considered to be responsible for the signal formation.eng
dc.formatPDF
dc.format.extentp. 1-4
dc.format.mediumtekstas / txt
dc.language.isoeng
dc.relation.isreferencedbyConference Proceedings Citation Index - Science (Web of Science)
dc.source.urihttp://proceedings.spiedigitallibrary.org/proceeding.aspx?articleid=1919875
dc.subjectFM02 - Energijos šaltinių medžiagos ir technologijos / Materials and technologies of energy sources
dc.titleDetection of microwave radiation on porous silicon nanostructures
dc.typeStraipsnis konferencijos darbų leidinyje Web of Science DB / Paper in conference publication in Web of Science DB
dcterms.accessRightsTomo antraštė: Eighth International Conference on Advanced Optical Materials and Devices (AOMD-8), (ISBN: 9781628415209)
dcterms.references12
dc.type.pubtypeP1a - Straipsnis konferencijos darbų leidinyje Web of Science DB / Article in conference proceedings Web of Science DB
dc.contributor.institutionValstybinis mokslinių tyrimų institutas Fizinių ir technologijos mokslų centras Vilniaus Gedimino technikos universitetas
dc.contributor.institutionVilniaus Gedimino technikos universitetas
dc.contributor.facultyFundamentinių mokslų fakultetas / Faculty of Fundamental Sciences
dc.subject.researchfieldN 002 - Fizika / Physics
dc.subject.researchfieldT 001 - Elektros ir elektronikos inžinerija / Electrical and electronic engineering
dc.subject.researchfieldT 008 - Medžiagų inžinerija / Material engineering
dc.subject.ltspecializationsL102 - Energetika ir tvari aplinka / Energy and a sustainable environment
dc.subject.enMicrowave radiation
dc.subject.enNanostructures
dc.subject.enSilicon
dc.subject.enOxides
dc.subject.enElectrochemical etching
dcterms.sourcetitleEighth International Conference on Advanced Optical Materials and Devices (AOMD-8), Riga, Latvia, August 25, 2014 : proceedings of SPIE.
dc.description.volumeVol. 9421
dc.identifier.doi10.1117/12.2083575
dc.identifier.elaba6003896


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