Technical applications of colossal magnetoresistance in thin manganite films for high pulsed magnetic field measurements

Abstract

Investigation of negative colossal magnetoresistance (CMR) phenomenon in thin La-Ca-Mn-O films at pulsed magnetic fields up to 30 T is presented. Epitaxial and polycrystalline films about 400 nm thick used in these investigations were grown using laser ablation or MOCVD techniques. It was found that in epitaxial high quality films. CMR is anisotropic and dependent on magnetic field direction with respect to the bias current and the surface of the film. In polycrystalline films, the CMR was observed to be independent of magnetic field orientation. Possible applications of these films for pulsed magnetic field measurements, especially in the case of complicated magnetic field configurations such as in electromagnetic metal forming processes, are discussed.