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dc.contributor.authorAnbinderis, Maksimas
dc.contributor.authorAšmontas, Steponas
dc.contributor.authorGradauskas, Jonas
dc.contributor.authorSužiedėlis, Algirdas
dc.contributor.authorDerkach, Vadim
dc.contributor.authorGolovashchenko, Roman
dc.date.accessioned2023-09-18T20:34:43Z
dc.date.available2023-09-18T20:34:43Z
dc.date.issued2020
dc.identifier.urihttps://etalpykla.vilniustech.lt/handle/123456789/151030
dc.description.abstractExperimental studies of novel design microwave sensors based on selectively doped semiconductor structure of asymmetrical shape revealed that the gated bow-tie diodes are proper candidates for detection of electromagnetic radiation in millimeter wave range. Location of the gate over the active layerof the diode influences its electrical and detection properties as well as polarity of the detected voltage. Addition of the gate makes the asymmetry of the bow-tie diode’s I-V characteristic more pronounced, what in turn results in higher voltage sensitivity value. If the gate is located by the wide contact, the sensitivity raises by one order of magnitude. When the gate is located at the narrow contact, the voltage sensitivity increases almost by two orders of magnitude in respect to the ungateddiode.eng
dc.formatPDF
dc.format.extentp. 907-911
dc.format.mediumtekstas / txt
dc.language.isoeng
dc.relation.isreferencedbyIEEE Xplore
dc.relation.isreferencedbyScopus
dc.rightsLaisvai prieinamas internete
dc.source.urihttps://ieeexplore.ieee.org/xpl/conhome/9252560/proceeding?pageNumber=9
dc.source.urihttps://talpykla.elaba.lt/elaba-fedora/objects/elaba:75242294/datastreams/MAIN/content
dc.subjectH600 - Elektronikos ir elektros inžinerija / Electronic and electrical engineering
dc.titleGated bow-tie diode with selectively doped 2DEG active layer for microwave sensing
dc.typeStraipsnis konferencijos darbų leidinyje Scopus DB / Paper in conference publication in Scopus DB
dcterms.references21
dc.type.pubtypeP1b - Straipsnis konferencijos darbų leidinyje Scopus DB / Article in conference proceedings Scopus DB
dc.contributor.institutionValstybinis mokslinių tyrimų institutas Fizinių ir technologijos mokslų centras Vilniaus Gedimino technikos universitetas
dc.contributor.institutionValstybinis mokslinių tyrimų institutas Fizinių ir technologijos mokslų centras
dc.contributor.institutionO.Ya. Usikov Institute for Radio Physics and Electronics, Kharkiv
dc.contributor.facultyElektronikos fakultetas / Faculty of Electronics
dc.contributor.facultyFundamentinių mokslų fakultetas / Faculty of Fundamental Sciences
dc.subject.researchfieldT 001 - Elektros ir elektronikos inžinerija / Electrical and electronic engineering
dc.subject.researchfieldN 002 - Fizika / Physics
dc.subject.studydirectionC02 - Fizika / Physics
dc.subject.vgtuprioritizedfieldsIK0202 - Išmaniosios signalų apdorojimo ir ryšių technologijos / Smart Signal Processing and Telecommunication Technologies
dc.subject.ltspecializationsL104 - Nauji gamybos procesai, medžiagos ir technologijos / New production processes, materials and technologies
dc.subject.ensensitivity
dc.subject.enbow-tie diod
dc.subject.engate
dc.subject.enthermoelectric electromotive force
dc.subject.enhot carriers
dc.subject.enselectively doped semiconductor structure
dc.subject.enmicrowave
dcterms.sourcetitle2020 IEEE Ukrainian Microwave Week (UkrMW) Kharkiv, Ukraine, September 21-25, 2020
dc.publisher.nameIEEE
dc.publisher.cityPiscataway, NJ
dc.identifier.elaba75242294


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