Theoretical simulations of scanning electrochemical microscope positioning system

Abstract

This paper deals with the scanning electrochemical microscope microelectrode (SECM) positioning methods. Constant height, constant distance, and hopping intermittent contact methods were analyzed. Control algorithms are created, and the system is programmed in MATLAB Simulink environment using the existing mathematical SECM negative feedback model. Simulations were made using these models and the results were compared with a known object. Results show that both, constant distance and HIC methods provided better results than the constant height positioning method.