Now showing items 1-2 of 2

    • Evaluation of Accuracy and Repeatability of Scanning Probe Microscope Positioning System 

      Rožėnė, Justė; Striška, Laisvidas; Trečiokaitė, Vaiva; Šutinys, Ernestas; Dzedzickis, Andrius; Morkvėnaitė-Vilkončienė, Inga (2021 IEEE Open Conference of Electrical, Electronic and Information Sciences (eStream), April 22, 2021, Vilnius, Lithuania, 2021)
      Scanning probe microscope (SPM) positioning system quality depends on the design of the positioning system, environmental factors, frictional forces, and load. The aim of our research is to determine the accuracy and ...
    • Multi-class Object Classification Model Based on Error-Correcting Output Codes 

      Patsei, Natallia; Tsybulka, Ksenia (2021 IEEE Open Conference of Electrical, Electronic and Information Sciences (eStream), April 22, 2021, Vilnius, Lithuania, 2021)
      The subject of this article is devoted to the problem of object classification. It's introduces a software model for the multi-class classification of image objects based on machine learning algorithms. The results of two ...