Browsing 2020 International Conference "Electrical, Electronic and Information Sciences“ (eStream)  by Subject "atomic force microscopy"

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    • Evaluation of Yeast Mechanical Properties by Atomic Force Microscopy 

      Morkvėnaitė-Vilkončienė, Inga; Dzedzickis, Andrius; Čereška, Deividas; Zinovičius, Antanas; Jakštas, Žilvinas; Bučinskas, Vytautas (2020 IEEE Open Conference of Electrical, Electronic and Information Sciences (eStream), April 30, 2020, Vilnius, Lithuania, 2020)
      Cells mechanical properties can show the living state of the cell since healthy cells and unhealthy cells have different mechanical properties. Atomic force microscopy (AFM) is an integral asset in such researches. In this ...