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dc.rights.licenseVisos teisės saugomos / All rights reserveden_US
dc.contributor.authorGao, Zhe
dc.contributor.authorLiobe, John C.
dc.contributor.authorBalon, Mark
dc.contributor.authorIgnjatovic, Zeljko
dc.contributor.authorFiscella, Mark
dc.contributor.authorBocko, Mark F.
dc.date.accessioned2025-11-24T11:10:41Z
dc.date.available2025-11-24T11:10:41Z
dc.date.issued2015
dc.identifier.urihttps://etalpykla.vilniustech.lt/handle/123456789/159432
dc.description.abstractA novel type of CMOS image sensor (CIS) leveraging two types of analog-to-digital converters (ADCs) is presented in this work. Contrary to conventional ΣΔ image sensors, which implement ΣΔ ADCs at the column or pixel array level, this work utilizes the pixel structure as part of the ΣΔ modulator to enhance the noise shaping capabilities of the readout scheme. The overall speed performance of this indirectfeedback (IF) ΣΔ image sensor is enhanced with the addition of a Successive Approximation Register (SAR) startup. The SAR startup has been successfully demonstrated on two prototype image sensors developed in a generic 0.35μm digital CMOS process. For the column-level, 320x180 pixel implementation, the SAR startup is included with minimal additional overhead, 1.8% of original ΣΔ column readout circuitry.en_US
dc.format.extent5 p.en_US
dc.format.mediumTekstas / Texten_US
dc.language.isoenen_US
dc.relation.urihttps://etalpykla.vilniustech.lt/handle/123456789/159386en_US
dc.source.urihttps://ieeexplore.ieee.org/document/7119491en_US
dc.subjectCMOS image sensoren_US
dc.subjectIndirect-feedback ΣΔ image sensoren_US
dc.subjecthigh dynamic rangeen_US
dc.subjecttime-domain simulatoren_US
dc.titleIndirect-feedback Sigma-Delta CMOS image sensors with SAR-based startupen_US
dc.typeKonferencijos publikacija / Conference paperen_US
dcterms.accrualMethodRankinis pateikimas / Manual submissionen_US
dcterms.issued2015-06-08
dcterms.references6en_US
dc.description.versionTaip / Yesen_US
dc.contributor.institutionUniversity of Rochesteren_US
dcterms.sourcetitle2015 Open Conference of Electrical, Electronic and Information Sciences (eStream), April 21, 2015, Vilnius, Lithuaniaen_US
dc.identifier.eisbn9781467374453en_US
dc.publisher.nameIEEEen_US
dc.publisher.countryUnited States of Americaen_US
dc.publisher.cityNew Yorken_US
dc.identifier.doihttps://doi.org/10.1109/eStream.2015.7119491en_US


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