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dc.rights.licenseVisos teisės saugomos / All rights reserveden_US
dc.contributor.authorSledevic, Tomyslav
dc.date.accessioned2025-12-10T08:16:58Z
dc.date.available2025-12-10T08:16:58Z
dc.date.issued2019
dc.identifier.isbn9781728125008en_US
dc.identifier.urihttps://etalpykla.vilniustech.lt/handle/123456789/159508
dc.description.abstractThe article presents integration process of convolution and batch normalization layer for further implementation on FPGA. The convolution kernel is binarized and merged with batch normalization into a core and implemented on single DSP. The concept is proven on custom binarized convolutional neural network (CNN) that is trained in Matlab to solve object localization task. 16 b precision gives 1.3 % error on the output of joined convolution and batch normalization core. The localization accuracy decreases in average by 7 % from 74 % to 67 %, and it is still tolerable in embedded systems applications.en_US
dc.format.extent4 p.en_US
dc.format.mediumTekstas / Texten_US
dc.language.isoenen_US
dc.relation.urihttps://etalpykla.vilniustech.lt/handle/123456789/159393en_US
dc.source.urihttps://ieeexplore.ieee.org/document/8732160en_US
dc.subjectConvolutional Neural Networken_US
dc.subjectKernel Binarizationen_US
dc.subjectBatch Normalizationen_US
dc.subjectGradient Descent Trainingen_US
dc.subjectFPGAen_US
dc.subjectObject localizationen_US
dc.titleAdaptation of Convolution and Batch Normalization Layer for CNN Implementation on FPGAen_US
dc.typeKonferencijos publikacija / Conference paperen_US
dcterms.accrualMethodRankinis pateikimas / Manual submissionen_US
dcterms.issued2019-06-06
dcterms.references19en_US
dc.description.versionTaip / Yesen_US
dc.contributor.institutionVilniaus Gedimino technikos universitetasen_US
dc.contributor.institutionVilnius Gediminas Technical Universityen_US
dc.contributor.departmentElektroninių sistemų katedra / Department of Electronic Systemsen_US
dcterms.sourcetitle2019 Open Conference of Electrical, Electronic and Information Sciences (eStream), April 25, 2019, Vilnius, Lithuaniaen_US
dc.identifier.eisbn9781728124995en_US
dc.publisher.nameIEEEen_US
dc.publisher.countryUnited States of Americaen_US
dc.publisher.cityNew Yorken_US
dc.identifier.doihttps://doi.org/10.1109/eStream.2019.8732160en_US


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