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dc.rights.licenseVisos teisės saugomos / All rights reserveden_US
dc.contributor.authorMorkvėnaitė-Vilkončienė, Inga
dc.contributor.authorDzedzickis, Andrius
dc.contributor.authorČereška, Deividas
dc.contributor.authorZinovičius, Antanas
dc.contributor.authorJakštas, Žilvinas
dc.contributor.authorBučinskas, Vytautas
dc.date.accessioned2025-12-12T11:24:53Z
dc.date.available2025-12-12T11:24:53Z
dc.date.issued2020
dc.identifier.isbn9781728197807en_US
dc.identifier.urihttps://etalpykla.vilniustech.lt/handle/123456789/159533
dc.description.abstractCells mechanical properties can show the living state of the cell since healthy cells and unhealthy cells have different mechanical properties. Atomic force microscopy (AFM) is an integral asset in such researches. In this paper, we presented the possibility to acquire mechanical properties of cells affected by 9,10-phenentrenequinone, which is very useful in biosensors and biofuel cells researches as lipophilic redox mediator. This material is also toxic to the living cells, and it becomes a challenge to detect the real effect on the cells before using it in biosensorics-related researches. AFM was utilized to assess the condition of living cells when they were influenced by 9,10-phenentrenequinone. Our results show that a very low 9 µM concentration of this material gives very little influence to cells’ mechanical properties, however cell exposure by 27 µM gives 2-times higher elastic modulus.en_US
dc.format.extent4 p.en_US
dc.format.mediumTekstas / Texten_US
dc.language.isoenen_US
dc.relation.urihttps://etalpykla.vilniustech.lt/handle/123456789/159395en_US
dc.source.urihttps://ieeexplore.ieee.org/document/9108864en_US
dc.subjectatomic force microscopyen_US
dc.subjectelastic modulusen_US
dc.subjectyeasten_US
dc.subjectSaccharomyces Cerevisiaeen_US
dc.titleEvaluation of Yeast Mechanical Properties by Atomic Force Microscopyen_US
dc.typeKonferencijos publikacija / Conference paperen_US
dcterms.accrualMethodRankinis pateikimas / Manual submissionen_US
dcterms.issued2020-06-05
dcterms.references27en_US
dc.description.versionTaip / Yesen_US
dc.contributor.institutionVilniaus Gedimino technikos universitetasen_US
dc.contributor.institutionVilnius Gediminas Technical Universityen_US
dc.contributor.institutionVilnius Universityen_US
dcterms.sourcetitle2020 IEEE Open Conference of Electrical, Electronic and Information Sciences (eStream), April 30, 2020, Vilnius, Lithuaniaen_US
dc.identifier.eisbn9781728197791en_US
dc.publisher.nameIEEEen_US
dc.publisher.countryUnited States of Americaen_US
dc.publisher.cityNew Yorken_US
dc.identifier.doihttps://doi.org/10.1109/eStream50540.2020.9108864en_US


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