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dc.rights.licenseVisos teisės saugomos / All rights reserveden_US
dc.contributor.authorBrusokas, Jonas
dc.contributor.authorPetkevičius, Linas
dc.date.accessioned2025-12-15T13:45:23Z
dc.date.available2025-12-15T13:45:23Z
dc.date.issued2020
dc.identifier.isbn9781728197807en_US
dc.identifier.urihttps://etalpykla.vilniustech.lt/handle/123456789/159555
dc.description.abstractComputed tomography (CT) is a widely used imaging technique in the medical field. During CT procedures patients are exposed to high amounts of radiation, posing a tangible threat to their health. Developed low-dose procedures lower exposure but produce noise and artifacts in images. To improve diagnostic accuracy, deep learning techniques are proposed to remove noises and artifacts from low-dose images. In this paper, the performance of several neural network architectures and similarity metrics as loss functions for low-dose CT image reconstruction are analyzed. Experimental results showed that selection of loss function can have significant impact on model performance, with the GSSIM metric outperforming other contemporary metrics SSIM, MSSSIM and MSE. Experiments were conducted using open-access and local cancer research institution data.en_US
dc.description.sponsorshipMayo Clinicen_US
dc.description.sponsorshipJonas Veniusen_US
dc.description.sponsorshipMarijus Astrauskasen_US
dc.description.sponsorshipLaurynas Šikšnysen_US
dc.description.sponsorshipGoogle Cloud Platform (GCP)en_US
dc.format.extent6 p.en_US
dc.format.mediumTekstas / Texten_US
dc.language.isoenen_US
dc.relation.urihttps://etalpykla.vilniustech.lt/handle/123456789/159395en_US
dc.source.urihttps://ieeexplore.ieee.org/document/9108883en_US
dc.subjectLow-dose CT reconstructionen_US
dc.subjectMedical image reconstructionen_US
dc.subjectU-Neten_US
dc.subjectU-Net++en_US
dc.subjectDenoisingen_US
dc.subjectDeep learningen_US
dc.subjectAutoencodersen_US
dc.titleAnalysis of Deep Neural Network Architectures and Similarity Metrics for Low-Dose CT Reconstructionen_US
dc.typeKonferencijos publikacija / Conference paperen_US
dcterms.accrualMethodRankinis pateikimas / Manual submissionen_US
dcterms.issued2020-06-05
dcterms.references43en_US
dc.description.versionTaip / Yesen_US
dc.contributor.institutionVilnius Universityen_US
dcterms.sourcetitle2020 IEEE Open Conference of Electrical, Electronic and Information Sciences (eStream), April 30, 2020, Vilnius, Lithuaniaen_US
dc.identifier.eisbn9781728197791en_US
dc.publisher.nameIEEEen_US
dc.publisher.countryUnited States of Americaen_US
dc.publisher.cityNew Yorken_US
dc.identifier.doihttps://doi.org/10.1109/eStream50540.2020.9108883en_US


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