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Modern designs for CMOS low-noise transimpedance amplifiers

dc.rights.licenseVisos teisės saugomos / All rights reserveden_US
dc.contributor.authorRomanova, Agata
dc.contributor.authorBarzdenas, Vaidotas
dc.date.accessioned2025-12-08T13:54:30Z
dc.date.available2025-12-08T13:54:30Z
dc.date.issued2018
dc.identifier.isbn9781538667385en_US
dc.identifier.urihttps://etalpykla.vilniustech.lt/handle/123456789/159496
dc.description.abstractSeveral different designs for low-noise transimpedance amplifiers (TIA) are presented and discussed. Comparison of main performance characteristics of the approaches is provided based on the available literature in order to determine the one best suited for the target application. Discussion on typical performance numbers achievable using the discussed approaches is supported by analysis of the results reported in previous works. Conclusions are drawn and suggestions are made regarding the suitability of reference topologies for implementation of low-noise CMOS TIA.en_US
dc.format.extent6 p.en_US
dc.format.mediumTekstas / Texten_US
dc.language.isoenen_US
dc.relation.urihttps://etalpykla.vilniustech.lt/handle/123456789/159391en_US
dc.source.urihttps://ieeexplore.ieee.org/document/8394121en_US
dc.subjectLow-noise amplifiersen_US
dc.subjectCMOS integrated circuitsen_US
dc.subjecttransimpedance amplifiersen_US
dc.titleModern designs for CMOS low-noise transimpedance amplifiersen_US
dc.typeKonferencijos publikacija / Conference paperen_US
dcterms.accrualMethodRankinis pateikimas / Manual submissionen_US
dcterms.issued2018-06-25
dcterms.references17en_US
dc.description.versionTaip / Yesen_US
dc.contributor.institutionVilniaus Gedimino technikos universitetasen_US
dc.contributor.institutionVilnius Gediminas Technical Universityen_US
dc.contributor.departmentKompiuterijos ir ryšių technologijų katedra / Department of Computer Science and Communications Technologiesen_US
dcterms.sourcetitle2018 Open Conference of Electrical, Electronic and Information Sciences (eStream), April 26, 2018, Vilnius, Lithuaniaen_US
dc.identifier.eisbn9781538667378en_US
dc.publisher.nameIEEEen_US
dc.publisher.countryUnited States of Americaen_US
dc.publisher.cityNew Yorken_US
dc.identifier.doihttps://doi.org/10.1109/eStream.2018.8394121en_US


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